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ISSUES BY YEAR

Volume 11 - 2015

Volume 10 - 2014

Volume 9 - 2013

Volume 8 - 2012

Volume 7 - 2011

Volume 6 - 2010

Volume 5 - 2009

Volume 4 - 2008

Volume 3 - 2007

Volume 2 - 2006

                                           EDITORIAL BOARD

Co-Editors-in-Chief
 
Dr. Dianxiang Xu, Professor, Department of Computer Science at Boise State University, USA
Dr. V.N.A. Naikan, Professor, Reliability Engineering Centre, IIT Kharagpur, India
 
Founder Editor-in-Chief
 
Krishna B. Misra, RAMS Consultants, Jaipur, India
Assistant Editors-in-Chief
Liudong Xing, University of  Massachusetts, Dartmouth, U.S.A.
Suprasad V. Amari, Relyence Corporation, Greensburg, PA, U.S.A.
S. K. Chaturvedi, Reliability Engineering Centre, IIT Kharagpur, India
 
Editorial Advisors
 
John D. Andrews,  University of Nottingham, U.K.
William E. Vesely, NASA Headquarters, U.S.A. 
 
Regional Editors
THE AMERICAS EUROPE ASIA PACIFIC SOUTH ASIA
Peter Sandborn
Terje Aven
D. N. P. Murthy N. K. Goyal
University of Maryland, U.S.A.  University of Stavanger, Norway University of Queensland, Australia

       REC, IIT Kharagpur,

    India

 

 

Editorial Board
Group 1: Product Design, Quality, Manufacturing Systems & Management and Human Factors Group 3: System Analysis and Computational Intelligence (Fuzzy sets, Neural Networks, Genetic Alg., BDD, Boolean Systems etc.) Group 5: System Safety & Risk Assessment, Management and Governance

Renkuan Guo, South Africa
Yuanshun Dai, U.S.A. Alexander V. Bochkov, Russia
Kailash Kapur, U.S.A.
Jean-Francois Dupuy, France
Enrique López Droguett , Brazil
Kazimierz Kosmowski, Poland Yuan Fuqing, Norway Seth Guikema, U.S.A.  
H. C. Moon, South Korea
Zhibin Jiang, China Takehisa Kohda, Japan 
Sudhendu Rai, U.S.A.
Gregory Levitin, Israel Hiromitsu Kumamoto, Japan
S. M. Rizwan, Oman Mustapha Nourelfath, Canada M. Modarres, U.S.A. 
Gordon J. Savage, Canada Sieteng Soh, Australia
Marvin Rausand, Norway 
Joseph Sharit, U.S.A. Kishor S. Trivedi, U.S.A.  Bernhard Reer, Switzerland 
Gurunatha Thimmaiah, U.S.A. Wenbing Zhao, U.S.A. Ortwin Renn, Germany 
John P. Ulhoi, Denmark Enrico Zio, Italy K. Suzuki, Japan
Masataka Yoshimura, Japan Ming J. Zuo, Canada
Piero Baraldi,  Italy
     

   

 

Group 2: Reliability Modelling, Analysis, Design, Testing and Demonstration Group 4: System Support, Supportability, Tribology, Maintenance & Maintainability Group 6: Sustainability (Design for Environment, Ecology and Environmental Management & Regulations)

Tadashi Dohi, Japan Olov Candell, Sweden Daoud Ait-Kadi, Canada
Indira Gunwan, Australia Gopi Chattopadhyay, Australia Leo Alting, Denmark
Lisa M. Jackson, U.K. Pierre Dersin, France  Beng Wah Ang, Singapore
Karama Kanoun, France B. S. Dhillon, Canada Giancarlo Barbiroli, Italy
John M. Kontoleon, Greece Andrew K. S. Jardine, Canada Claver Diallo, Canada 
Nikolaos Limnios, France Renyan Jiang, China Toni Gladding, U.K. 
Yi-Kuei Lin, Taiwan Bhupesh Kumar Lad, India Karolos J. Kontoleon, Greece  
Anatoly Lisnianski, Israel Viliam Makis, Canada Francesco Di Maio, Italy
Hoang Pham, U.S.A. Toshio Nakagawa, Japan Hans Schnitzer, Austria
Suresh Rai, U.S.A. Aditya Parida, Sweden Walter R. Stahel, Switzerland
Michael Todinov, U.K.   Preeti Wanti Srivastava, India Paritosh Tyagi, India
 
 
 
 

 

Associate Editors
     
Michael Grottke, Germany
Mohammad Asjad, India
Zhaojun (Steven) Li, U.S.A.
  R.Sundaramurthi, India 
 

 

Technology Advisor



Rayomond Chinoy, Level9Solutions, USA

 

 

 

In addition to the members of Editorial Board,  we have other reviewers as well, who help us in the refereeing process. Acknowledgement to such reviewers is published in the last issue of the year.

 
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